Abstract: Highlights•An optimized L2,1<math><msup is="true"><mrow is="true"><mi is="true">L</mi></mrow><mrow is="true"><mn is="true">2</mn><mo is="true">,</mo><mn is="true">1</mn></mrow></msup></math> metric is used for VSA method.•A novel patch-aware similarity metric is proposed.•We improve SDF calculation by using anisotropic smoothing.•The patch and part aware similarities are adaptively combined into a uniform metric.•A hierarchy of segmentations are obtained with our hierarchical splat clustering.
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