Uncertainty for deep image classifiers on out of distribution data. Download PDF

Sep 28, 2020 (edited Mar 05, 2021)ICLR 2021 Conference Blind SubmissionReaders: Everyone
  • Reviewed Version (pdf): https://openreview.net/references/pdf?id=nmV6t8HIN
  • Keywords: uncertainty, confidence, out of distribution, outlier exposure, classification
  • Abstract: In addition to achieving high accuracy, in many applications, it is important to estimate the probability that a model prediction is correct. Predictive uncertainty is particularly important on out of distribution (OOD) data where accuracy degrades. However, models are typically overconfident, and model calibration on OOD data remains a challenge. In this paper we propose a simple post hoc calibration method that significantly improves on benchmark results [Ovadia et al 2019] on a wide range of corrupted data. Our method uses outlier exposure to properly calibrate the model probabilities.
  • One-sentence Summary: improving on benchmark estimates of model uncertainty on OOD data, using outlier exposure
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