CLUE: Non-parametric Verification from Experience via Hidden-State Clustering

ICLR 2026 Conference Submission21395 Authors

19 Sept 2025 (modified: 08 Oct 2025)ICLR 2026 Conference SubmissionEveryoneRevisionsBibTeXCC BY 4.0
Keywords: Verification, LLM, Training-free, Non-parametric
Abstract: Assessing the quality of Large Language Model (LLM) outputs presents a critical challenge. Previous methods either rely on text-level information (e.g., reward models, majority voting), which can overfit to superficial cues, or on calibrated confidence from token probabilities, which woule fail on less-calibrated models. Yet both of these signals are, in fact, partial projections of a richer source of information: the model’s internal hidden states. Early layers, closer to token embeddings, preserve semantic and lexical features that underpin text-based judgments, while later layers increasingly align with output logits, embedding confidence-related information. This paper explores hidden states directly as a unified foundation for verification. We show that the correctness of a solution is encoded as a geometrically separable signature within the trajectory of hidden activations. To validate this, we present CLUE (Clustering and Experience-based Verification), a deliberately minimalist, non-parametric verifier. With no trainable parameters, CLUE only summarizes each reasoning trace by an hidden state delta and classifies correctness via nearest-centroid distance to "success" and "failure" clusters formed from past experience. The simplicity of this method highlights the strength of the underlying signal. Empirically, CLUE consistently outperforms LLM-as-a-judge baselines and matches or exceeds modern confidence-based methods in reranking candidates, improving both top-1 and majority-vote accuracy across AIME 24/25 and GPQA. As a highlight, on AIME 24 with a 1.5B model, CLUE boosts accuracy from 56.7\% (majority@64) to 70.0\% (top-maj@16).
Primary Area: applications to computer vision, audio, language, and other modalities
Submission Number: 21395
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