Scaling Sparse Feature Circuits For Studying In-Context Learning

Published: 05 Mar 2025, Last Modified: 23 Apr 2025SLLMEveryoneRevisionsBibTeXCC BY 4.0
Track: tiny / short paper (up to 4 pages)
Keywords: SAE, ICL, SFC, Interpretability, Gemma, LLM, Mechanistic Interpretability, Sparse Autoencoders, Circuits
TL;DR: Explaing In Context Learning by finding circuits in terms of sparse autoencoder latents, on much larger models than have been studied before
Abstract: Sparse autoencoders (SAEs) are a popular tool for interpreting large language model activations, but their utility in addressing open questions in interpretability remains unclear. In this work, we demonstrate their effectiveness by using SAEs to deepen our understanding of the mechanism behind in-context learning (ICL). We identify abstract SAE features that (i) encode the model’s knowledge of which task to execute and (ii) whose latent vectors causally induce the task zero-shot. This aligns with prior work showing that ICL is mediated by task vectors. We further demon- strate that these task vectors are well approximated by a sparse sum of SAE latents, including these task-execution features. To explore the ICL mechanism, we adapt the sparse feature circuits methodology of Marks et al. (2024) to work for the much larger Gemma-1 2B model, with 30 times as many parameters, and to the more complex task of ICL. Through circuit finding, we discover task-detecting features with corresponding SAE latents that activate earlier in the prompt, that detect when tasks have been performed. They are causally linked with task-execution features through the attention and MLP sublayers.
Anonymization: This submission has been anonymized for double-blind review via the removal of identifying information such as names, affiliations, and identifying URLs.
Submission Number: 56
Loading

OpenReview is a long-term project to advance science through improved peer review with legal nonprofit status. We gratefully acknowledge the support of the OpenReview Sponsors. © 2025 OpenReview